- Tennessee law bans posting images that “cause emotional distress”
Timothoy B. Lee at Ars Technica describes the latest in Tennessee’s efforts to update state laws for the internet age and it is puzzling in the extreme. Every aspect of this law seems intensely problematic from the ridiculously vague notion of distressing to the overly broad scope, that anyone who sees such an image, not just an intended target, can trigger a criminal complaint. Not to mention the question of just how on earth the law will be enforced, especially against those posting and hosting outside the state.
- Bank not responsible for $300K stolen by hackers from customer
Kim Zetter at Wired’s Threat Level explains the pertinent details of a ruling in favor of a bank sued for failing to notify a commercial customer about out of character activity resulting in over $300K being stolen. The theft occurred as a result of a breach on the customer’s systems, not the banks so this isn’t about hackers attacking the bank where it would make more sense for them to bear liability. Rather the ruling weighs in on reasonable expectations in the face of unusual activity, the kind that triggers fraud alerts. The judge even seemed sympathetic to the customer by was bound by the current laws which don’t require the level of effort that would have prevent or minimized the theft further.
- Why we love LulzSec
Xeni at BoingBoing linked to a risky.biz post that shares the thinking of many a security expert and enthusiast with regards to LulzSec. Namely the hacktivist group is largely acting on what many of us merely have been saying in general and specifically to potential targets for years. Well worth a read as I think it puts LulzSec into the right context, that they are acting for the reasons they state, the “lulz” or schadenfreude.
- Senator seeks to crack down on Bitcoin, The Baltimore Sun via Technology Liberation Front
- An argument in support of Facebook’s approach to facial recognition, O’Reilly Radar
- IBM researchers demo graphene integrated circuit on SiC wafer, EE Times